Uncovsky, M: search on Z-Library

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1

Low-Energy Secondary Electron Filtering with Immersion Lens SEM

Young, R, Bosch, E, Uncovsky, M, Tuma, L

Journal:

Microscopy and Microanalysis

Year:

2009

Language:

english

File:

PDF, 634 KB

english, 2009

2

Scanning transmission low-energy electron microscopy

Mullerova, I., Hovorka, M., Konvalina, I., Uncovsky, M., Frank, L.

Journal:

IBM Journal of Research and Development

Year:

2011

Language:

english

File:

PDF, 3.64 MB

english, 2011

3

Very low energy electron microscopy of graphene flakes

MIKMEKOVÁ, E., BOUYANFIF, H., LEJEUNE, M., MÜLLEROVÁ, I., HOVORKA, M., UNČOVSKÝ, M., FRANK, L.

Journal:

Journal of Microscopy

Year:

2013

Language:

english

File:

PDF, 428 KB

english, 2013

4

Determination of the basic parameters characterizing the roughness of metal surfaces by laser light scattering

Ohlídal, Miloslav, Unĉovský, Marek, Ohlídal, Ivan, Franta, Daniel

Journal:

Journal of Modern Optics

Year:

1999

Language:

english

File:

PDF, 655 KB

english, 1999

5

Secondary electron imaging at gas pressures in excess of 1 kPa

Toth, Milos, Uncovsky, Marek, Ralph Knowles, W., Baker, Francis S.

Journal:

Applied Physics Letters

Year:

2007

Language:

english

File:

PDF, 554 KB

english, 2007

6

In Situ Imaging of Hydrated Specimens at Room Temperature in ESEM

Chen, J, Neijssen, WAJ, Stokes, DJ, Uncovsky, M

Journal:

Microscopy and Microanalysis

Year:

2008

Language:

english

File:

PDF, 420 KB

english, 2008

7

In-situ Observation of Solutions by WetSTEM

Wandrol, P., Unčovský, M., Vystavěl, T.

Journal:

Microscopy and Microanalysis

Year:

2012

Language:

english

File:

PDF, 768 KB

english, 2012

8

“Secondary electron spectra of semi-crystalline polymers – A novel polymer characterisation tool?”

Dapor, Maurizio, Masters, Robert C., Ross, Ian, Lidzey, David, Pearson, Andrew, Abril, Isabel, Garcia-Molina, Rafael, Sharp, Jo, Unčovský, Marek, Vystavel, Tomas, Mika, Filip, Rodenburg, Cornelia

Journal:

Journal of Electron Spectroscopy and Related Phenomena

Year:

2017

Language:

english

File:

PDF, 1.61 MB

english, 2017

9

In Lens BSE detector with Energy Filtering

Radlička, Tomáš, Unčovský, Marek, Oral, Martin

Journal:

Ultramicroscopy

Year:

2018

Language:

english

File:

PDF, 2.18 MB

english, 2018

10

Tilt-free EBSD

Vystavěl, Tomáš, Stejskal, Pavel, Unčovský, Marek, Stephens, Chris

Journal:

Microscopy and Microanalysis

Year:

2018

Language:

english

File:

PDF, 757 KB

english, 2018

11

Expanding Capabilities of Low-kV STEM Imaging and Transmission Electron Diffraction in FIB/SEM Systems

Vystavěl, Tomáš, Tůma, Lubomír, Stejskal, Pavel, Unčovský, Marek, Skalický, Jan, Young, Richard

Journal:

Microscopy and Microanalysis

Year:

2017

Language:

english

File:

PDF, 442 KB

english, 2017